DETERMINATION OF OPTICAL CONSTANTS OF
POLYMETHYLMETACRILAT FILMS THROUGH REFLECTION
The transmittance values measured in IR reflection-absorption (RA)
spectra can be used to determine the optical constants of dielectric films laid on
solid substrates.
To obtain the optical constants of polymethylmetacrilat films laid on
nickel we used dispersion analysis. In this case, the optical constants are
obtained from IR spectrum recorded at a single incidence angle and
transmission IR spectrum. Using dispersion analysis offers the advantage of
processing a large volume of data.
Cuvinte cheie: reflexie-absorbŃie, constante optice, spectre IR, analiza
de dispersie
