Simion JITIAN


30-09 REFLEXIA INTERNĂ A LUMINII MONOCROMATICE PE FILME SUPERFICIALE DEPUSE PE SUBSTRATURI SOLIDE

THE INTERNAL REFLECTION OF MONOCHROMATIC LIGHT
ON SUPERFICIAL FILMS ON SOLID SUBSTRATES
Internal partial or total reflection present similitude and differences with
external reflection depending on the incidence angle of the light. Total reflection
has a major theoretical importance because complex aspects concerning the
interaction between light and superficial film. Both the analysis of the
parameters that decide upon the type of reflection and the manner of
interaction of the light with superficial films allow correct interpretation of
experimental measurements. Internal attenuated total reflection is one method
of investigation “in situ” of superficial films illustrated in this paper.
Keywords: internal reflection, superficial film, angle limit penetration
depth
Cuvinte cheie: reflexie internă, film superficial, unghi limită, adâncime
de pătrundere

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18-10 DETERMINAREA CONSTANTELOR OPTICE ALE FILMELOR DE POLIMETACRILAT DE METIL PRIN MĂSURĂTORI DE REFLEXIE

DETERMINATION OF OPTICAL CONSTANTS OF
POLYMETHYLMETACRILAT FILMS THROUGH REFLECTION
The transmittance values measured in IR reflection-absorption (RA)
spectra can be used to determine the optical constants of dielectric films laid on
solid substrates.
To obtain the optical constants of polymethylmetacrilat films laid on
nickel we used dispersion analysis. In this case, the optical constants are
obtained from IR spectrum recorded at a single incidence angle and
transmission IR spectrum. Using dispersion analysis offers the advantage of
processing a large volume of data.
Cuvinte cheie: reflexie-absorbŃie, constante optice, spectre IR, analiza
de dispersie

10 DETERMINAREA CONSTANTELOR OPTICE ALE